Dynamic Timing Analysis Considering Power Supply Noise Effects
نویسندگان
چکیده
Noise eeects such as power supply and crosstalk noise can signiicantly impact the performance of deep submicron designs. Existing timing analysis tecniques cannot capture the eeects of noise on the signal/cell delays. This is because these delay eeects are highly input pattern dependent. Therefore, the predicted circuit performance might not reeect the worst-case circuit delay. In this paper, we propose a dynamic timing analysis technique that can take into account the impact of the power supply noise on the signal/cell propagation delays. Our technique is based on considering the input patterns that produce the worst-case power supply noise eeects on the propagation delays of the longest true paths in the circuit. Our experimental results show that the circuit delay predicted by our dynamic timing analysis method is signiicantly longer than the delay predicted using traditional timing analysis tools.
منابع مشابه
Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects
Noise effects such as power supply and crosstalk noise can significantly impact the performance of deep submicrometer designs. Existing delay testing and timing analysis techniques cannot capture the effects of noise on the signal/cell delays. Therefore, these techniques cannot capture the worst case timing scenarios and the predicted circuit performance might not reflect the worst case circuit...
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